Yield modelling and defect tolerance in VLSI : papers presented at the International Workshop on Designing for Yield, Oxford, 1-3 July 1987 /

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Bibliographic Details
Corporate Author:	International Workshop on Designing for Yield Oxford, Oxfordshire
Other Authors:	Moore, Will, Maly, W., Strojwas, Andrzej J.
Format:	Conference Proceeding Book
Language:	English
Published:	Bristol ; Philadelphia : A. Hilger, [1988], ©1988.
Subjects:	Integrated circuits > Very large scale integration > Design and construction > Congresses. Integrated circuits > Very large scale integration > Design and construction. Integrated circuits. Conference papers and proceedings.

Annex

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Call Number:	TK 7874 .I475 1987
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