Protocol test systems, III : proceedings of the IFIP TC6 Third International Workshop on Protocol Test Systems /

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Bibliographic Details
Corporate Authors: IFIP TC6 International Workshop on Protocol Test Systems McLean, Va., International Federation for Information Processing. Technical Committee 6., Corporation for Open Systems International
Other Authors: Davidson, Ian, 1944-, Litwack, David M.
Format: Conference Proceeding Book
Language:English
Published: Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1991.
Subjects: