Self-testing VLSI design /

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Bibliographic Details
Main Author:	I︠A︡rmolik, V. N. (Vi︠a︡cheslav Nikolaevich)
Other Authors:	Kachan, I. V.
Format:	Book
Language:	English
Published:	Amsterdam ; New York : Elsevier, 1993.
Subjects:	Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design. Computers > Integrated circuits > Design Integrated circuits.

Annex

Holdings details from Annex
Call Number:	TK 7874 .I16 1993
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