Advances and applications in the metallography and characterization of materials and microelectronic components : proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society /

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Bibliographic Details
Corporate Author:	International Metallographic Society. Technical Meeting
Other Authors:	Stevens, D. W.
Format:	Book
Language:	English
Published:	Columbus, Ohio : Materials Park, Ohio : International Metallographic Society ; ASM International, [1996], ©1996.
Series:	Microstructural science ; v. 23.
Subjects:	Metallography > Congresses. Metallography > Industrial applications > Congresses. Microelectronics > Materials > Microscopy > Congresses. Metallography. Microelectronics > Materials. Microelectronics. Microscopy. Conference papers and proceedings.

Annex

Holdings details from Annex
Call Number:	TN 690 .I71
23	Available Request Request a scan of an article or book chapter Contents The following works are all found in the book indicated by the call number above. Advances and applications in the metallography and characterization of materials and... Microstructural science.