Semiconductor memories : technology, testing, and reliability /
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| Hlavní autor: | |
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| Korporativní autor: | |
| Format: | Kniha |
| Jazyk: | angličtina |
| Published: |
Piscataway, N.J. :
IEEE Press,
[1997], ©1997.
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| Témata: |
Annex
| Signatura: |
TK 7895 .M4 S49 1997
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| Dostupné Požadavek Request a scan of an article or book chapter |