Lock-in thermography : basics and use for functional diagnostics of electronic components /
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
New York :
Springer,
[2003], ©2003.
|
| Series: | Springer series in advanced microelectronics ;
v.10. |
| Subjects: |
Annex
| Call Number: |
TK 7870.25 .B74 2003
|
|---|---|
| Available Request Request a scan of an article or book chapter |