Testing static random access memories : defects, fault models, and test patterns /
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Boston :
Kluwer Academic,
[2004], ©2004.
|
| Series: | Frontiers in electronic testing ;
26. |
| Subjects: |
Annex
| Call Number: |
TK 7895 .M4 H343 2004
|
|---|---|
| Available Request Request a scan of an article or book chapter |