Statistical performance analysis and modeling techniques for nanometer VLSI designs /

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Bibliographic Details
Main Author:	Shen, Ruijing
Other Authors:	Tan, Sheldon X. D., Yu, Hao
Format:	Book
Language:	English
Published:	New York ; London : Springer, 2012.
Subjects:	Integrated circuits > Very large scale integration > Statistical methods. Nanoelectronics > Statistical methods. Algorithms. Integrated circuits > Very large scale integration. Integrated circuits. Statistics. Nanoelectronics.

Hesburgh Library General Collection

Holdings details from Hesburgh Library General Collection
Call Number:	TK 7874.75 .S54 2012
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