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Corporate Authors: Symposium on Semiconductor Memory Testing, Cherry Hill Township, N.J., IEEE Computer Society. Mideastern Area Committee, IEEE Computer Society. Philadelphia Chapter
Format: Conference Proceeding Book
Language:English
Published: New York : Institute of Electrical and Electronics Engineers, [1973], ©1973.
Subjects:
Semiconductor storage devices > Testing > Congresses.
Semiconductor storage devices > Testing.
Semiconductor storage devices.
Conference papers and proceedings.
Item Description:"Sponsored by the IEEE Computer Society Mideastern Area Committee and the Philadelphia Chapter of the Institute of Electrical and Electronics Engineers."
Physical Description:v, 126 pages : illustrations ; 28 cm

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