Testing semiconductor memories : theory and practice /

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Bibliographic Details
Main Author:	Goor, A. J. van de
Format:	Book
Language:	English
Published:	Chichester ; New York : J. Wiley & Sons, 1991.
Subjects:	Semiconductor storage devices > Testing. Semiconductor storage devices.

Annex

Holdings details from Annex
Call Number:	TK 7895 .M4 G655 1991
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