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Bibliographic Details
Continued as:	Ieee International Symposium on Defect and Fault Tolerance in VLSI Systems. Proceedings
Formerly known as:	Defect and fault tolerance in VLSI systems
Corporate Authors:	International Workshop on Defect and Fault Tolerance in VLSI Systems, IEEE Computer Society, IEEE Computer Society. Fault-Tolerant Computing Technical Committee
Format:	Conference Proceeding
Language:	English
Published:	Los Alamitos, CA : IEEE Computer Society Press, 1991-1995.
Subjects:	Integrated circuits > Very large scale integration > Design and construction > Congresses. Integrated circuits > Fault tolerance > Congresses. Integrated circuits > Very large scale integration > Design and construction. Integrated circuits. Integrated circuits > Fault tolerance. Conference papers and proceedings.
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Annex

Holdings details from Annex
Call Number:	TK 7874 .D415
Volume Holdings:	1994-1995
1994	Available Request Request a scan of an article or book chapter
1995	Available Request Request a scan of an article or book chapter