Defect and fault tolerance in VLSI systems.

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Bibliographic Details
Continued as:	International Workshop on Defect and Fault Tolerance in VLSI Systems Proceedings
Corporate Author:	International Workshop on Defect and Fault Tolerance in VLSI Systems
Format:	Conference Proceeding
Language:	English
Published:	New York : Plenum Press, [1989-1990], ©1989-1990.
Subjects:	Integrated circuits > Very large scale integration > Design and construction > Congresses. Fault-tolerant computing > Congresses. Integrated circuits > Very large scale integration > Design and construction. Integrated circuits. Fault-tolerant computing. Conference papers and proceedings.
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Annex

Holdings details from Annex
Call Number:	TK 7874 .D415
Volume Holdings:	v.1-v.2
1	Available Request Request a scan of an article or book chapter
2	Available Request Request a scan of an article or book chapter