The use of acoustic emission to determine the integrity of large kovar glass-sealed microelectronic packages /

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Bibliographic Details
Main Author:	Harman, George G.
Corporate Authors:	Naval Avionics Center (U.S.), United States. National Bureau of Standards
Format:	Government Document Book
Language:	English
Published:	Washington, D.C. : [Springfield, Va.] : U.S. Department of Commerce, National Bureau of Standards ; [National Technical Information Service, distributor], 1982.
Series:	NBS special publication ; 400-70. Semiconductor measurement technology.
Subjects:	Acoustic emission. Microelectronics.

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Call Number:	C 13.10:400-70
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