The use of acoustic emission to determine the integrity of large kovar glass-sealed microelectronic packages /
Salvato in:
| Autore principale: | |
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| Enti autori: | , |
| Format: | Documento governativo Libro |
| Lingua: | inglese |
| Published: |
Washington, D.C. : [Springfield, Va.] :
U.S. Department of Commerce, National Bureau of Standards ; [National Technical Information Service, distributor],
1982.
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| Serie: | NBS special publication ;
400-70. Semiconductor measurement technology. |
| Soggetti: |
Hesburgh Library GovDocs SuDoc Fiche [Lower Level]
| Collocazione: |
C 13.10:400-70
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