Records of the IEEE International Workshop on Memory Technology, Design, and Testing /

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Bibliographic Details
Corporate Authors:	IEEE International Workshop on Memory Technology, Design, and Testing, IEEE Computer Society. Test Technology Technical Committee, IEEE Computer Society. Technical Committee on VLSI
Format:	Conference Proceeding
Language:	English
Published:	Los Alamitos, Calif. : IEEE Computer Society Press, ©1994-
Subjects:	Semiconductor storage devices > Testing > Congresses. Random access memory > Congresses. Semiconductor storage devices > Testing. Semiconductor storage devices. Random access memory. Conference papers and proceedings.
Open Policy Finder:	Search Open Policy Finder by ISSN

Description
Published:	Aug. 8-9 (1994)-
Physical Description:	volumes : illustrations ; 28 cm Also issued online.
Publication Frequency:	Annual
ISSN:	1087-4852
Varying Form of Title:	Some vols. have title: Records of the ... IEEE International Workshop on Memory Technology, Design, and Testing
Portion of Title:	Memory Technology, Design, and Testing

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