Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Saved in:

Bibliographic Details
Main Author:	Bushnell, Michael L. (Michael Lee), 1950-
Other Authors:	Agrawal, Vishwani D., 1943-
Format:	Book
Language:	English
Published:	Boston : Kluwer Academic, [2000], ©2000.
Series:	Frontiers in electronic testing.
Subjects:	Integrated circuits > Very large scale integration > Testing. Digital integrated circuits > Testing. Mixed signal circuits > Testing. Semiconductor storage devices > Testing. Integrated circuits. Digital integrated circuits. Mixed signal circuits. Semiconductor storage devices.

Hesburgh Library General Collection

Holdings details from Hesburgh Library General Collection
Call Number:	TK 7874.75 .B87 2000
	Available Request Request a scan of an article or book chapter