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|a 0792379918 (alk. paper)
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|z Fastcat 2001-02-09
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|a (OCoLC)44926977
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|a TK7874.75
|b .B87 2000
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| 082 |
0 |
0 |
|a 621.39/5
|2 21
|
| 100 |
1 |
|
|a Bushnell, Michael L.
|q (Michael Lee),
|d 1950-
|0 http://id.loc.gov/authorities/names/n88015041
|
| 245 |
1 |
0 |
|a Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
|c Michael L. Bushnell, Vishwani D. Agrawal.
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| 260 |
|
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|a Boston :
|b Kluwer Academic,
|c [2000], ©2000.
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| 300 |
|
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|a xviii, 690 pages :
|b illustrations ;
|c 26 cm.
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| 336 |
|
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|a text
|b txt
|2 rdacontent
|0 http://rdaregistry.info/termList/RDAContentType/1020
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| 337 |
|
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|a unmediated
|b n
|2 rdamedia
|0 http://rdaregistry.info/termList/RDAMediaType/1007
|
| 338 |
|
|
|a volume
|b nc
|2 rdacarrier
|0 http://rdaregistry.info/termList/RDACarrierType/1049
|
| 340 |
|
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|p illustration
|2 rdaill
|0 http://rdaregistry.info/termList/IllusContent/1014
|
| 490 |
1 |
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|a Frontiers in electronic testing
|
| 504 |
|
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|a Includes bibliographical references (p. [631]-670) and index.
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|x Testing.
|0 http://id.loc.gov/authorities/subjects/sh2009127319
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| 650 |
|
0 |
|a Digital integrated circuits
|x Testing.
|
| 650 |
|
0 |
|a Mixed signal circuits
|x Testing.
|
| 650 |
|
0 |
|a Semiconductor storage devices
|x Testing.
|
| 650 |
|
7 |
|a Integrated circuits
|x Very large scale integration
|x Testing.
|2 fast
|0 (OCoLC)fst00975618
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| 650 |
|
7 |
|a Integrated circuits.
|2 fast
|0 (OCoLC)fst00975535
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| 650 |
|
7 |
|a Digital integrated circuits
|x Testing.
|2 fast
|0 (OCoLC)fst00893702
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| 650 |
|
7 |
|a Digital integrated circuits.
|2 fast
|0 (OCoLC)fst00893692
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| 650 |
|
7 |
|a Mixed signal circuits
|x Testing.
|2 fast
|0 (OCoLC)fst01024108
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| 650 |
|
7 |
|a Mixed signal circuits.
|2 fast
|0 (OCoLC)fst01024105
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| 650 |
|
7 |
|a Semiconductor storage devices
|x Testing.
|2 fast
|0 (OCoLC)fst01112185
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| 650 |
|
7 |
|a Semiconductor storage devices.
|2 fast
|0 (OCoLC)fst01112182
|
| 700 |
1 |
|
|a Agrawal, Vishwani D.,
|d 1943-
|0 http://id.loc.gov/authorities/names/n88254492
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| 830 |
|
0 |
|a Frontiers in electronic testing.
|0 http://id.loc.gov/authorities/names/n92107662
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| 994 |
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|b IND
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|p Circulating
|a University of Notre Dame
|b University of Notre Dame
|c Hesburgh Library
|s Hesburgh Library General Collection
|d Hesburgh Library General Collection
|t 0
|e TK 7874.75 .B87 2000
|h Library of Congress classification
|i Book
|m 00000020302147
|