Probability of detection of internal voids in structural ceramics using microfocus radiography /

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Bibliographic Details
Main Author:	Baaklini, George Y.
Corporate Author:	Lewis Research Center
Other Authors:	Roth, Don J.
Format:	Government Document Microfilm Book
Language:	English
Published:	[Cleveland, Ohio] : [National Aeronautics and Space Administration, Lewis Research Center], [1985]
Series:	NASA technical memorandum ; 87164.
Subjects:	Silicon carbide. Silicon nitride. Ceramic materials. Ceramics. Radiography. Sintering. Statistical analysis. Voids.

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Call Number:	NAS 1.15: 87164
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