Radiographic detectability limits for seeded voids in sintered silicon carbide and silicon nitride /

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Bibliographic Details
Main Author:	Baaklini, George Y.
Corporate Author:	United States. National Aeronautics and Space Administration
Other Authors:	Kiser, James D., Roth, Don J.
Format:	Government Document Microfilm Book
Language:	English
Published:	[Washington, D.C.] : National Aeronautics and Space Administration, [1985]
Series:	NASA technical memorandum ; 86945.
Subjects:	Detection. Radiography. Reaction bonding. Sensitivity. Silicon carbides. Silicon nitrides.

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Call Number:	NAS 1.15: 86945
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