Radiographic detectability limits for seeded voids in sintered silicon carbide and silicon nitride /
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| Main Author: | |
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| Corporate Author: | |
| Other Authors: | , |
| Format: | Government Document Microfilm Book |
| Language: | English |
| Published: |
[Washington, D.C.] :
National Aeronautics and Space Administration,
[1985]
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| Series: | NASA technical memorandum ;
86945. |
| Subjects: |
| Physical Description: | 1 volume. |
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| Reproduction Note: | Microfiche. |