Fundamental principles of engineering nanometrology /
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Amsterdam ; Boston :
Elsevier/William Andrew,
[2010], ©2010.
|
| Edition: | First edition. |
| Series: | Micro & nano technologies.
|
| Subjects: |
Hesburgh Library General Collection
| Call Number: |
T 174.7 .L43 2010
|
|---|---|
| Available Request Request a scan of an article or book chapter |