Fundamental principles of engineering nanometrology /

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Bibliographic Details
Main Author: Leach, R. K.
Format: Book
Language:English
Published: Amsterdam ; Boston : Elsevier/William Andrew, [2010], ©2010.
Edition:First edition.
Series:Micro & nano technologies.
Subjects:
Description
Physical Description:xxvi, 321 pages : illustrations ; 24 cm.
ISBN:9780080964546 (hbk.)
0080964540 (hbk.)