The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements /
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| Main Author: | |
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| Corporate Author: | |
| Other Authors: | |
| Format: | Government Document Microfilm Book |
| Language: | English |
| Published: |
Gaithersburg, MD :
U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology,
1997.
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| Series: | NIST special publication ;
260-131. Standard reference materials. |
| Subjects: |
Hesburgh Library GovDocs SuDoc Fiche [Lower Level]
| Call Number: |
C 13.10: 260-131
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