The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements /

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Bibliographic Details
Main Author:	Ehrstein, James R.
Corporate Author:	National Institute of Standards and Technology (U.S.)
Other Authors:	Croarkin, M. C. (Mary Carroll), 1934-
Format:	Government Document Microfilm Book
Language:	English
Published:	Gaithersburg, MD : Washington, DC : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1999.
Edition:	1999 edition.
Series:	NIST special publication ; 260-131. Standard reference materials.
Subjects:	Silicon. Silicon > Electric properties.

Hesburgh Library GovDocs SuDoc Fiche [Lower Level]

Holdings details from Hesburgh Library GovDocs SuDoc Fiche [Lower Level]
Call Number:	C 13.48/4: 260-131
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