The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements /
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| Format: | Documento governativo Microfilm Libro |
| Lingua: | inglese |
| Published: |
Gaithersburg, MD : Washington, DC :
U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1999.
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| Edizione: | 1999 edition. |
| Serie: | NIST special publication ;
260-131. Standard reference materials. |
| Soggetti: |
Hesburgh Library GovDocs SuDoc Fiche [Lower Level]
| Collocazione: |
C 13.48/4: 260-131
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